Makmal XRD - Kak Farah Farini 2.0

PERKHIDMATAN ANALISIS
INSTRUMENTASI

UNIT MAKMAL

Fakulti Sains Gunaan
Brosur

X-RAY DIFFRACTION (XRD)
INSTRUMENT



BRAND: PANalytical XPert Pro
MODEL : PW060/40
SERIAL NO: DY2536

KOD HARTA : 2007003575



Minimum Sample Requirement:

Powder Sample – minimum 0.03g / quarter vial
Thin Film – Length x width (2.5 cm x 2.7 cm)
Thickness (above 100nm)

Instrument Information:

X-ray diffraction is one of the most characterization tools used in
solid-state chemistry and materials science. X-rays are
electromagnetic radiation of wavelength about 1Å (10− 10m), which
is about the same size as an atom. They occur in that portion of the
electromagnetic spectrum between gamma rays and ultraviolet. X-
ray diffraction has been used in two main areas, for the fingerprint
characterization of crystalline materials and the determination of
their structure. Once the material has been identified, it may be used
to determine its structure like how the atoms pack together in the
crystalline state and what the interatomic distance and angle, etc.

Routinely,

Range: 2theta range of 5 to 70 degrees is sufficient to cover the
most useful part of the pattern.
Scanning speed: 2theta of 2degrees min− 1 (complete one cycle –
20 minutes) but also depend on the need of the samples to obtain a
trace.

PUAN NURFARAH FARINI Makmal X-ray Diffraction
BT MUHAMAD KAMARAZZAMAN (XRD)

Penolong Pegawai Sains BILIK : OM 341

No. Telefon Pejabat : +603-5544 4426

Faks : +603-5544 4426

Emel: [email protected]

PERSON - IN - CHARGE

PUAN NURFARAH FARINI
BT MUHAMAD KAMARAZZAMAN
Penolong Pegawai Sains

No. Telefon Pejabat :
+603-5544 4426
Faks : +603-5544 4426

Emel: [email protected]

Makmal X-ray Diffraction
(XRD)

BILIK : OM 341