Alpha Presentation (Rev 1)-for customer_2019

ALPHATM

Sustainability Of Sustainability Of

Specification Performance

Kelvin & Selected Kelvin
Scrubbing Contacting Solution
Compatible to Spring Probe Platform
for Dual Row QFN, QFN, QFP, SOIC, TSOP

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JF Microtechnology Sdn Bhd (718186-U)

ASubsidiary ofJFTechnology Berhad

Alpha delivers

Do You Need Alpha Offers

Self cleaning Scrubbing (< 0.15mm)
Sustainable CRes Single piece cantilever pin (< 25mΩ)
High current testing
Tri-temp testing of -45’C to +155’C > 4A continuous
Reliable temp test with single piece pin
Longer lifespan test solution
construction
Sustainable 1st Pass Yield (FPY)
Loadboard friendly > 500K insertions (pin)
> 6M insertions (housing)
Lower Cost of Test (CoT)
Longer MTBA & MTBF
No wearing on loadboard

Higher OEE

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Alpha design methodology

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5Alpha Design Features for

SUSTAINABILITY of
Specification & Performance

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Design Feature #1 : Spring probe platform compatibility
Benefit : Low or Zero Hardware Investment

Plug and Play

Selected Leadless Non-Kelvin
Kelvin Leadless Kelvin

Selected Leaded Non-Kelvin
Kelvin Leaded Kelvin

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Design Feature #1 : Spring probe platform compatibility
Benefit : Low or Zero Hardware Investment

Plug and Play

Customizable for different socket platform

Multitest 9510 QFP 14x20 Seiko Epson QFN 5x5

SRM MSOP 8L Delta Edge QFN 4x4

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Design Feature #1 : Spring probe platform compatibility
Benefit : Low or Zero Hardware Investment

Plug and Play

Customizable for different socket platform

DR-QFN 12x12, 164Lds, 0.5P

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Design Feature #2 : Scrubbing / Self cleaning
Benefit : Less cleaning frequency

Alpha has 0.12mm wiping length compared to vertical spring probe

Alpha Spring
Probe

Wiping length

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Design Feature #3 : Single piece cantilever pin
Benefit : Sustainable CRes and high current testing

Less mechanical component of pin compared to typical spring probe

Alpha Spring Probe

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JF Microtechnology Sdn Bhd (718186-U)

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Design Feature #3 : Single piece cantilever pin
Benefit : Sustainable CRes and high current testing

Less mechanical component of pin compared to typical spring probe

Alpha Spring Probe

Contact Surface Contact Surface
Lead Angle Lead Angle

Equal True Contact Uneven Contact

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Design Feature #4 : Longer lifespan of components
Benefit : Lower down CoT

Sustainability of performance even after a long run

Actual: Endurance Test Result (In-House)

0K 200K 500K 800K 1M

Endurance Settings:

Deflection : 0.20mm Frequency : 3Hz

Temperature : Ambient Cycle Count : 200k

300k

There’s no sign of pin breakage after 1M insertions 300k

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Design Feature #4 : Longer lifespan of components
Benefit : Lower down CoT

Sustainability of performance even after a long run

Actual: Endurance Test Result (In-House)

Imprint mark at 1M

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Design Feature #5 : Loadboard friendly
Benefit : Cost reduction in loadboard repair

Bottom part is independent from pin tip movement

Bottom part of the pin is isolated from pin tip
movement

Zone 1 : Actuating

Locking area

Zone 2 : Stationary

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Success Story ASubsidiary ofJFTechnology Berhad

Criteria Before (Spring probe) After (Alpha)

Pin lifespan 60 ~ 80K > 600K
MTBA Average 2 hours > 24 hrs
MTBF Average 13 days > 90 days
> 95%
1st pass yield Average 92%

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Cost of Test (CoT) ASubsidiary ofJFTechnology Berhad

Lifespan Typical spring probe Alpha

Socket housing > 1M > 6M
Contact pin 60 ~ 80K > 600K

$250,000 90%
80%
$200,000 70%
60%
$150,000 50% Alpha
40% Competitor
$100,000 30% % Saving
20%
$50,000 10%
0%
$0 1000000 2000000 3000000 4000000 5000000 6000000
0

76.79%Alpha gives savings!

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Super High Performance Test Contact Solutions

ZIGMA TM JF Microtechnology Sdn Bhd (718186-U)

Higher Revenue, Lower Cost AWSubesidBiarry ionf JFgTecPhnoolsogsyiBberihlaidties
Since 1999